17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM 2016
10.08.2016
Участие в XVII Международной конференции EDM (IEEE, EDM 2016) 2016, Эрлагол, Алтай, 30 июня - 4 июля. Представлены шесть докладов по тематике разработки микросхем силовой электроники, радиолокации и МЭМС генераторам энергии.
Antonov A.A., Karpovich M.S., Pichugin I.V., Vasilyev V.Yu., Multi-functional control integrated circuits in 250 nm BCD technology for high-efficiency power converters // Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p.411-416.
Karpovich M.S., Lys V.D., Blum K.E., Vasilyev V.Yu., Electrostatic discharge protection in 250 nm BCD technology for multi-functional control integrated circuits for power converters // Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p.456-461.
Ryzhhkov V.A., Antonov A.A., Karpovich M.S., Vasilyev V.Yu., Active output rectifier controller IC in 250 nm BCD technology for high-efficiency power converters // Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p. 611-616.
Ryzhhkov V.A., Karpovich M.S., Surin I.K., Vasilyev V.Yu., High-voltage low drop output voltage regulator with output current fold-back protection in 250 nm BCD technology // Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p. 549-554.
Anton A.Cherepanov;Victor V. Perov;Andrey A. Drozdov;Yuri M. Ivanov, Model of wideband RF short-distance locator// Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p. 201 – 204.
Anton A.Cherepanov;Vasiliy D. Lys, Test submicron integrated circuit for wideband RF short-distance locator with noise modulation//Proceedings of 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices EDM, 2016, p.p.205–209.